题    目：High-Resolution Scanning Electron Microscope

主讲人：Dr. Shunsuke ASAHINA（Group leader, JEOL Ltd.）

时    间：4月22日（星期一）下午15:30 — 17:30

地    点：化学馆241室

Dr. Shunsuke ASAHINA，is currently Group leader for Application planning group at JEOL Ltd and specially appointed professor at Institute of Multidisciplinary Research for Advanced Materials, Tohoku University. He got his Ph.D. in Chemical Engineering from Tohoku university. His current research focuses on low voltage SEM on Nano structured materials and its elucidation of the physical phenomena. And he is interested in research of coffee as well. He is Japan Coffee Qualification Authority (JCQA) Certified Associate Coffee Instructor.

Abstract

To understand surface fine structures and their compositions is essential for controlling the growth of these materials and for the future material design and the utilization of their functions. Recent technical developments in high resolution scanning electron microscopy have made it possible to acquire invaluable information about them even though the materials are electrical insulating and electron beam sensitive such as Zeolites. Here, we will discuss surface observation methods and condition optimization using the latest SEM.To understand surface fine structures and their compositions is essential for controlling the growth of these materials and for the future material design and the utilization of their functions. Recent technical developments in high resolution scanning electron microscopy have made it possible to acquire invaluable information about them even though the materials are electrical insulating and electron beam sensitive such as Zeolites. Here, we will discuss surface observation methods and condition optimization using the latest SEM.